D4T Systems can provide customers with services and consultancy support on a variety of analog mixed signal related test activities. We have expertise on both design-for-test (DFT) for AMS blocks in design as well as experience in production related test improvement. In all the services we provide, test cost reduction and test quality are considered to be the most important drivers for test improvement.
We can support you in the following test areas:

Design related test improvement

Together with our customers we develop innovative, breakthrough solutions in AMS test early in the design phase. Design analysis, a wide test expertise in analog and digital test and knowledge from  test research and international test standards are all explored to the fullest to come to innovative solutions for our customer. You can think further of:

• Test strategy and test architecture definition
• Design-for-test for analog mixed signal circuit design
• Test interface definition (JTAG) and alternative multiplexed test busses (SPI, I2C).
• Test signal routing using Analog and digital on-chip test busses
• Design and test services with IEEE test standard support (JTAG).
• Probe points and optimized on-chip monitoring
• Services on (partial) BIST definition
• Innovative approaches for AMS testing dedicated to your design.

Production related test improvement

Even if re-design is not possible anymore and is ready for production, test improvements can still be made. We can help you on the following topics to decrase your test cost in production:

• Test sequence and test order optimization
• Test data analysis (experimental data and statistical analysis)
• Test redundancy analysis
• Reject oriented analysis
• Coverage analysis
  

Tool and flow related test development

Automation in AMS test is key in decreasing test cost for future designs. Together with our customers we provide services to come to an automated test development and quality estimation of the test plan. All this is done specific for your IC design.

• Test automation for AMS test development
• Validation of test plan at pre-silicon
• Test coverage analysis at pre-silicon
• Test order calculation
• Innovative test approaches supported by automation tooling